Scanning Electron Microscope (SEM)

This Schottky emission gun SEM (1.2 nm resolution at 30kV) is equipped with a conventional Everhart-Thornley secondary detector, a retractable DEBEN-BSED-GEN5 backscatter detector, an Oxford Aztec EDS (energy-dispersive spectrometer) and EBSD (electron backscatter diffraction) system.​